Book chapters

Koren, E.; Allen, J.E.; Givan, U.; Berkovitch, N.; Hemesath, R.E.; Lauhon, L.J.; and Rosenwaks, Y.; “Nano-Scale measurements of dopants and electronic impurities in individual silicon nanowires using Kelvin probe force microscopy”, Nanowires – Implementations and Applications, Abbass Hashim (Ed.), ISBN: 978-953-307-318-7, 2011, InTech. Link